15–20 Feb 2010
TU Vienna
Europe/Vienna timezone

A prototype chip for pixel hybrid detector in 90 nm CMOS technology

Not scheduled
HS 1 (TU Vienna)

HS 1

TU Vienna

Wiedner Hauptstrasse 8-10 Vienna, Austria
Board: A14
Poster C

Speaker

Dr Robert Szczygiel (AGH University of Science and Technology)

Description

Using a deep submicron technology available on the marked we have designed a pixel readout chip called PX90 (Pixel Xray 90nm) for high-count-rate digital X-ray imaging applications with semiconductor detectors. The ASIC has been fabricated in TSMC 90 nm CMOS process with 9 metal layers. The single pixel size is 100 x 100 um2, while the prototype chip contains the matrix of 40 x 32 pixels. The article presents the PX90 architecture and the measurement results including both functional and X-ray imaging tests.

Summary (Additional text describing your work. Can be pasted here or give an URL to a PDF document):

http://home.agh.edu.pl/~robert/pub/PX90_Vienna2010.pdf

Primary authors

Prof. Pawel Grybos (AGH University of Science and Technology) Dr Piotr Maj (AGH University of Science and Technology) Dr Robert Szczygiel (AGH University of Science and Technology)

Presentation materials

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