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Overview of electrical tests on HL-LHC prototype diode stack

Europe/Zurich
30/3-023 (CERN)

30/3-023

CERN

12
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    • 11:00 12:00
      Overview of electrical tests on HL-LHC prototype diode stack 1h

      Proposed agenda:
      • Introduction (Giorgio)
      • Summary of electrical test at 300K/77K (Giorgio)
      • Overview of electrical at SM18 (300K/4 K) (Gerard)
      • Conclusion

      Speakers: Gerard Willering (CERN), Giorgio D'Angelo (CERN)