Speaker
Sven Oras
(University of Tartu)
Description
In this work Cu electrodes were characterized with AFM and SEM. The AFM topology map was used to create a field enhancement map of the surface. SEM images show different structures with multi-scale roughness. A hypothesis for CuO protrusion growth on the Cu electrodes is introduced.
| Topic | Experiments and Diagnostics |
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Primary author
Sven Oras
(University of Tartu)
