Speaker
Guillaume Beuf
Description
In this talk, we will discuss the back-to-back limit of the DIS dijet production at next-to-eikonal accuracy computed in a highly boosted gluon background field within the Color Glass Condensate (CGC) framework. We will show that the various types of next-to-eikonal corrections can be written as field strength insertions on the CGC Wilson lines which provide direct relation with the gluon TMDs defined from the two-point correlators of the field strength. We will then discuss the interplay between the subeikonal corrections in the CGC and the higher twist corrections in the TMD factorization.
| Submitted on behalf of a Collaboration? | No |
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Primary authors
Tolga Altinoluk
Guillaume Beuf
Alina Czajka
(National Centre for Nuclear Research)
Cyrille Marquet
(CPHT - Ecole Polytechnique)
