Sep 26 – 30, 2011
Vienna, Austria
Europe/Zurich timezone

Noise and radiation hardness of 65 nm CMOS transistors and pixel front-ends

Sep 27, 2011, 5:00 PM
20m
Room EI 7 (Vienna, Austria)

Room EI 7

Vienna, Austria

<font face="Verdana" size="2"><b>Vienna University of Technology</b> Department of Electrical Engineering Gusshausstraße 27-29 1040 Vienna, Austria
MUG

Speaker

Massimo Manghisoni (Università degli Studi di Bergamo)

Presentation materials