May 27 – 31, 2024
Chulalongkorn University
Asia/Bangkok timezone

Leptogenesis in a Left-Right Symmetric Model with double seesaw

May 27, 2024, 2:30 PM
15m
Chulalongkorn University

Chulalongkorn University

Mahamakut Building, Faculty of Science, Chulalongkorn University
Parallel session Neutrino physics Parallel - 1

Speaker

Mr UTKARSH PATEL (Indian Institute of Technology, Bhilai)

Description

We explore the connection between low-scale CP-violating Dirac phase $(\delta)$ and high-scale leptogenesis in a Left-Right Symmetric Model (LRSM) with scalar bidoublet and doublets. The fermion sector of the model is extended with one sterile neutrino $(S_L)$ per generation to implement a double seesaw mechanism in the neutral fermion mass matrix. The double seesaw is performed via the implementation of type-I seesaw twice. The first seesaw facilitates the generation of Majorana mass term for heavy right-handed (RH) neutrinos $(N_R)$, and the light neutrino mass becomes linearly dependent on $S_L$ mass in the second. In our framework, we have taken charge conjugation ($C$) as the discrete left-right (LR) symmetry. This choice assists in deriving the Dirac neutrino mass matrix ($M_D$) in terms of the light and heavy RH neutrino masses and light neutrino mixing matrix $U_{PMNS}$ (containing $\delta$). We illustrate the viability of unflavored thermal leptogenesis via the decay of RH neutrinos by using the obtained $M_D$ with the masses of RH neutrinos as input parameters. A complete analysis of the Boltzmann equations describing the asymmetry evolution is performed in the unflavored regime, and it is shown that with or without Majorana phases, the CP-violating Dirac phase is sufficient to produce the required asymmetry in the leptonic sector within this framework for a given choice of input parameters. Finally, we comment on the possibility of constraining our model with the current and near-future oscillation experiments, which are aimed at refining the value of $\delta$.

Primary author

Mr UTKARSH PATEL (Indian Institute of Technology, Bhilai)

Co-authors

Mr Pratik Adarsh (Indian Institute of Technology, Bhilai) Mr Purushottam Sahu (Indian Institute of Technology, Bhilai) Mr Sudhanwa Patra (Indian Institute of Technology, Bhilai)

Presentation materials