Speaker
Mark Sutton
(McGill)
Description
The ability to measure small deformations or strains is useful for understanding many aspects of materials especially in soft condensed matter systems. Systematic shifts of speckles arising from small angle x-ray coherent diffraction when analyzed enable flow patterns of particle in the elastomers to be inferred. This information is obtained from cross-correlations of speckle patterns. This speckle tracking technique measures strain patterns with a accuracy similar to X-ray single crystal measurements but in amorphous or highly disordered materials.
Keyword-1 | X-ray Diffraction |
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Keyword-2 | coherence |
Keyword-3 | XPCS |
Primary author
Mark Sutton
(McGill)