Name: ERAM Meeting
Start: 2024-01-15T11:00:00+01:00
End: 2024-01-15T12:00:00+01:00
Location: No location set

- 11:00 → 11:45
  ERAM status
  
  Conveners: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
  - 11:00
    
    ERAM production status at Rui's lab 5m
    
    Speakers: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
    
    - ERAM-46 will be tested today by Antonio. We should have a feedback from him wether or not the HV test in air is ok and if this ERAM needs a cleaning
  - 11:05
    
    Mesh pulsing 10m
    
    Speakers: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
  - 11:15
    
    ERAM gluing 5m
    
    Speakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
  - 11:20
    ERAM testing 10m
    
    Speakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
    
    ERAM-46 cartes du mesh pulsing 8 & 9
    
    ERAM-39 : should be scanned with FEC cards affected to ERAM-33 : fec 15 & 76
    
    This week: scan 39 with FEC 15 & 76
  - 11:30
    ERAM AOB 15m
    
    Speakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
    
    Serious problem on the reliabilkity of the mesh connection to GND with the 2 pin connector + jumper
    
    inspection of all remaining ERAMs must be done to
    
    assess the reliability of the 2 pin connector soldering + fixing with glue
    
    assess the quality of the contact with the jumper (glue shortening the contact length for instance)
    
    after this survey we will decide if we bypass the connector with a wire (what will be done on 3 ERAM of the bottom TPC) on some ERAMs or all of them (the preferred and safest solution)