ERAM Meeting
→
Europe/Zurich
Alain Delbart
(Université Paris-Saclay (FR)),
David Henaff
(CEA),
Guillaume Eurin
(CEA/IRFU/DPhP),
Laura-Iuliana Munteanu
(CERN)
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ERAM statusConveners: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
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ERAM production status at Rui's labSpeakers: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
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Mesh pulsingSpeakers: Alain Delbart (Université Paris-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
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ERAM gluingSpeakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
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ERAM testingSpeakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura Munteanu (CERN), Laura-Iuliana Munteanu (CERN)
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ERAM AOBSpeakers: Alain Delbart (Université Paris-Saclay (FR)), Charlotte Riccio (CEA-Saclay (FR)), David Henaff (CEA), Guillaume Eurin (CEA/IRFU/DPhP), Laura-Iuliana Munteanu (CERN)
- Serious problem on the reliabilkity of the mesh connection to GND with the 2 pin connector + jumper
- inspection of all remaining ERAMs must be done to
- assess the reliability of the 2 pin connector soldering + fixing with glue
- assess the quality of the contact with the jumper (glue shortening the contact length for instance)
- after this survey we will decide if we bypass the connector with a wire (what will be done on 3 ERAM of the bottom TPC) on some ERAMs or all of them (the preferred and safest solution)
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