BISv2 Reliability Study Progress Meeting - CIBAB

Present: M. Blaszkiewicz, A. Collinet, L. Felsberger, T. Podzorny, I. Romera Ramirez  

Minutes

The presentation showed general statistics from the failure rate prediction step, proposed end-effects definitions, top contributors to the overall failure rate and remaining questions to conclude. 

In the discussion, the following points were made:

Next steps

  1. Share the FMECA table with Antoine.
  2. Follow-up the failure rate prediction of transistors and TVS diodes in 217Plus standard.