INFN, Perugia Unit
Author in the following contributions
- TCAD modeling of bulk and surface radiation damage effects in silicon devices
- Timing resolution of thin LGAD sensors for high radiation environments
- Characterization of the FBK-LGAD devices manufactured at an external foundry for large-volume productions
- Development and Wafer-level Characterization of the First Production of DC-RSD Sensors at FBK
- Test beam characterisation of the first DC-coupled Resistive Silicon Detector FBK production
