Name: RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics
Start: 2025-01-23T09:00:00+01:00
End: 2025-01-23T10:00:00+01:00
Location: CERN

- 09:00 → 09:20
  
  Cryogenics CHARM radiation campaign results and IC life testing 20m
  
  Speaker: Nikolaos Chatzipapas (CERN)
  
  Cryogenics CHARM radiation campaign results and IC life testing.pdf
  
  Cryogenics CHARM radiation campaign results and IC life testing.pptx
- 09:20 → 09:50
  
  Reliability Testing Infrastructure at CERN: An Overview of the QART Lab 30m
  
  Speaker: Abhishek Sharma (CERN)
  
  ASharma_RAWG_Seminar_2025_01_23.pdf
- 09:50 → 10:00
  
  Discussion 10m

RAWG Meeting: Equipment Life Testing and Reliability Analysis for Electronics

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