Session 1: Irradiation facilities in Europe
Yolanda Morilla (University of Seville) - Session Chair
Gerd Datzmann (Datzmann Interact and Innovate)
Overview on irradiation facilities within RADNEXT 2030
Bio:
Dr. Gerd Datzmann is a physicist by education and specialized in nuclear and accelerator physics at the Technical University Munich (TUM). During his PhD project, he developed and operated a nuclear microprobe for high energy protons and heavy ions. After his PhD, Gerd Datzmann became head of physics at a company that built the first privately financed proton therapy center for cancer treatment in Europe, the RPTC in Munich.
In 2016, Dr. Datzmann founded his company Datzmann interact & innovate GmbH (DINI). DINI provides a portfolio of services centering on accelerator applications in the field of advanced material analytics, proton therapy and radiation hardness testing. DINI is a partner in the EU-program RADNEXT and will be partner in RADNEXT 2030 as well. In general, DINI is actively engaged in outreach and dissemination as well as in technology transfer activities in the field of radiation hardness testing. One focus of DINI is helping irradiation facilities to start or optimize their services to industrial customers in the field of radiation hardness testing.
Abstract:
Radiation hardness qualification of electronic components, systems, and boards requires testing at specialized facilities that can reproduce realistic radiation environments. These include sources of protons, heavy ions, neutrons, electrons, gamma rays, and, in some cases, pulsed X-rays or lasers. Such radiation fields are typically generated at particle accelerators or research reactors, which are predominantly operated by universities or publicly funded research institutions. As a result, industrial users, space agencies, and academic researchers depend on these facilities as external, fee-based service providers.
Over the past decades, many European research facilities have opened access to external users, offering a fraction of their beam time in a more service-oriented framework. However, due to their primary focus on research, only limited beam time is available for commercial applications. At the same time, demand for irradiation testing has increased significantly over the last ten years across Europe, North America, and Asia. This growth is driven by the expansion of space activities as well as the rising importance of radiation effects in terrestrial applications, such as aviation, safety-critical electronics, and harsh environments including high-energy accelerators and nuclear reactors.
To address the gap between facility availability and user demand, the EU-funded RADNEXT program was launched in 2021, bringing together 21 facilities and offering transnational access to irradiation infrastructure free of charge for academic and industrial users. Following its success, the continuation program RADNEXT 2030 was approved in early 2026 and will start in June 2026. In addition to single event effects (SEE) testing, it will also expand into total ionizing dose (TID) and displacement damage (DD) testing.
This presentation provides an overview of the irradiation facilities within the RADNEXT 2030 network, highlighting their key technical capabilities. The focus will be on standard qualification facilities for protons, heavy ions, and neutrons, while also addressing complementary sources such as gamma facilities and laser-based SEE testing. The talk aims to offer a concise and up-to-date perspective on the evolving landscape of irradiation infrastructures.
José de Martín Hernández (CNA)
Database of irradiation facilities: Extension to industry-related information
Bio:
José de Martín Hernández received the Mathematics and Statistics degrees from the University of Seville, Spain, in 2021 and the Master’s Degree in Big Data from the Miguel de Cervantes European University, Spain in 2024. He is a data scientist and researcher at the Centro Nacional de Aceleradores (CNA), associated with the University of Seville, Spain. His work centers on experimental data analysis and predictive modelling applied to irradiation testing of electronic devices and materials, contributing to projects involving accelerator‑based experiments and radiation effects research. His professional background includes roles in data science and research support at CNA as well as collaborations on technical publications analyzing radiation test results and statistical modelling.
Abstract:
In the framework of the EU-funded AIDA-2020 project, a CERN online database was created in 2017 to list in a user-friendly way the key information about worldwide irradiation facilities. The listed infrastructures were originally mainly of interest to the large High Energy Physics (HEP) community for testing particle detectors prototypes, qualifying electronics components & systems, as well as for characterizing the radiation hardness of materials. Later from 2022, within the RADNEXT project, one task focused on updating, extending, and maintaining these facilities data trying to bring it closer to industry and other research fields beyond HEP. Thus, its dissemination and promotion aimed to strengthen its development and evolution towards the radiation effects community’s needs. For instance, the Irradiation Facilities database is nowadays at the basis of the RADNEXT Transnational Access portal used for the submission, review, and follow-up of RADNEXT experiment proposals as well as for the assignment of a RADNEXT facility and beam time to the accepted ones. After reviewing the main characteristics of the CERN database, this contribution will also detail the most recent attempt to extend and complement the available information for a subset of industry-related radiation-effect facilities. This is an initiative of the Industry working group of the RADECS Association Steering Committee, which arises within the framework of updating the traditional facilities compendium.
Alessandra Costantino (ESA/ESTEC)
Co‑60 TID Irradiation Testing Intercomparisons: Review of Previous Campaigns and Outlook for an Extended Exercise
Bio:
Alessandra Costantino coordinates and supports beamtime use for internal ESA projects and external users for Radiation Hardness Assurance testing. Her role includes ESTESC Co60 Facility operation, user support during campaigns, and ensuring consistent dosimetry practices aligned with Radiation Hardness Assurance requirements. She also contributes to inter‑laboratory comparisons and continuous improvement of Co‑60 TID services, supporting reliable and traceable irradiation testing for space and high‑reliability electronics across diverse mission and technology readiness contexts.
Abstract:
Total Ionizing Dose (TID) testing using Co‑60 gamma irradiation remains a cornerstone of radiation hardness assurance for space and other high‑reliability electronic applications. Ensuring consistency, traceability, and comparability of dosimetry measurements across different irradiation facilities is therefore essential.
This talk presents the results and lessons learned from previous laboratories intercomparison campaigns on Co‑60 TID dosimetry involving multiple European irradiation facilities and outlines the protocol and objectives of a forthcoming intercomparison campaign designed to build on previous exercises and to further enhance confidence in TID testing methodologies.
The upcoming intercomparison campaign will involve irradiation facilities operating under EN ISO/IEC 17025 accreditation, while also including, to a lesser extent, a number of non‑accredited laboratories for comparative and exploratory purposes. The accredited laboratories will provide the main reference framework, ensuring traceable and well‑documented dosimetry results. The participation of non‑accredited facilities, with a more limited scope, is intended to offer a broader overview of current practices and to provide insight into the level of agreement achievable outside a formal accreditation framework. In addition to dosimetry comparisons, the campaign will include the irradiation of commercial off‑the‑shelf (COTS) MOSFET batch and assess device‑level responses. A combined approach that aims to address both metrological accuracy and components testing results.
The intercomparison highlights the importance of harmonized methodologies and well‑defined uncertainty budgets. It also aims to provide practical recommendations to improve reproducibility across facilities, and cross‑checks using independent dosimetry systems.
Overall, such interlaboratory comparisons play a critical role in strengthening confidence in TID test results and in ensuring the reliability of radiation qualification data. By combining metrological approach with application‑oriented considerations, the planned campaign seeks to support best‑practice recommendations, promote transparency in TID testing, and provide valuable guidance to users qualifying electronic components across a diverse range of Co‑60 irradiation facilities.
Christoph Tscherne (Seibersdorf Laboratories)
ISO/IEC 17025 in Practice: Ensuring Quality in Radiation Testing
Bio:
Christoph Tscherne heads the Aerospace Radiation Competence Center at Seibersdorf Laboratories, Austria, a leading provider of radiation hardness assurance and irradiation testing services. With over a decade of experience in radiation effects engineering, he specializes in irradiation testing and radiation hardness assurance for space and high-reliability applications. Among other tasks he leads the technical and quality management of the ISO/IEC 17025 accredited TEC-Laboratory, a Co-60 TID testing facility providing radiation testing services according to ESCC, ECSS and MIL standards.
Abstract:
This presentation provides a concise introduction to ISO/IEC 17025 and its role in ensuring competence, reliability, and quality in testing laboratories, illustrated through the example of the TEC-Laboratory Seibersdorf, an ISO/IEC 17025 accredited Co-60 TID irradiation testing facility. Focusing on irradiation environments, the talk highlights the key requirements of the standard and how they translate into everyday laboratory practice, both for facility operators and for users of such services.
Within the presentation, core elements of certification are addressed, including quality management, traceability, method validation, and uncertainty evaluation. Particular attention is given to the practical relevance of ISO 17025 in irradiation testing, where reproducibility and accuracy are essential for both research and industrial applications.
In addition, the role of intercomparisons is discussed as a critical tool for demonstrating measurement consistency and laboratory competence. A practical example will be presented to illustrate how such comparisons support confidence in test results across different facilities.
The value of ISO 17025 is assessed from an industrial user perspective, emphasizing how accredited laboratories contribute to informed decision-making, regulatory compliance, and risk reduction in real-world applications.
Session 2: From Industry to Industry
Philipp Bender (Infineon) and Francesco Pintacuda (STMicroelectronics) - Session Chairs
Renaud Mangeret (Airbus Defence & Space)
Title TBD
Bio and abstract coming soon.
Maxim Gorbunov (IMEC)
On Single-Event Effects Sensitivity Characterization of Modern FinFET technologies
Bio:
Maxim Gorbunov works as R&D engineer in imec (Belgium). After receiving his “specialist” and Ph.D. degrees from the National Research Nuclear University “MEPhI” (Moscow, Russia) in 2008 and 2010, respectively, he worked as the IC designer and radiation expert in Scientific Research Institute for the System Analysis of the Russian Academy of Sciences (until 2020) and in the JSC “Specialized Electronic Systems” (SPELS) (until 2023). Maxim joined imec at the beginning of 2023 and, since 2024, has worked as the technical lead of the INFINIT project, while also being involved in the ESA-funded UDSM projects as an IC designer and radiation expert.
Abstract:
The rising demand for space-based data handling and Artificial Intelligence (AI) applications requires high reliable and computationally effective components. The ultra deep-submicron (UDSM) technologies are attractive for the applications with extensive usage of General Purpose Processors (GPP) and Accelerators (GPA) for Digital Signal Processing (DSP), Digital Beamforming and Artificial Intelligence (AI) / Machine Learning (ML) applications. 7-nm FinFET technology is a good candidate for being the base process. In recent years, a lot of results were published on the topic of Total Ionizing Dose and Single Event Effects sensitivity study for FinFET technology nodes down to 3-nm. However, the development of design platforms for radiation hardened ICs requires a broad and deep study of the technology sensitivity, which must take into account the distinctive features of the process and corresponding radiation effects. The ESA-funded “INFINIT” project aims to deeply study the radiation effects in the 7-nm FinFET devices and circuits, and provide reliable hardening solutions. The results of the project will be the basis of the new DARE platform from imec.
Such a technology sensitivity study consists of several stages. In the talk, we share our experience in the following topics related to heavy ion and high energy proton testing:
- Prior to tests: what we know and what we don’t know about the technology;
- At the heavy ion facility: ion sequence, functional tests at room temperature and high temperature, and power supply variation in vacuum chambers;
- At the high energy proton facility: testing from the front and back sides to take into account the possible secondary particles events from the Back-end-of-line (BEOL).
We also discuss the facility needs that would support this kind of research, including laser, heavy ion and low energy protons facilities.
Christian Felgemacher (ROHM)
CR robustness testing of power semiconductor devices and requirements on test facilities
Bio:
Christian Felgemacher received the MEng (Hons) degree in electronics and electrical engineering with management from the University of Edinburgh in 2011 and the Dr.-Ing. degree from the University of Kassel in 2018. As a research assistant at the University of Kassel he investigated reliability aspects of power semiconductors in PV inverters including cosmic ray robustness and the utilization of wide-band-gap devices in renewable energy applications. Since April 2017 he is with ROHM Semiconductor and since 2023 he is responsible for the European team of FAEs and AEs.
Abstract:
In this presentation we will briefly introduce ROHM as a Japanese semiconductor manufacturer and will focus on our products in the area of power semiconductors. The main part of the presentation will be to introduce our European team’s approach to performing cosmic radiation robustness testing of power semiconductor devices. This part will focus on how we perform testing and how the resulting measurement data is used by us and our customers. Finally, we will share our views on requirements for testing facilities in Europe.
Keynote talk - Cristina Plettner (ESA)
Radiation Hardness Assurance in ESA projects: From a CubeSat to a Space Weather Mission
Bio:
Mrs. Cristina Plettner holds a Ph. D. in Experimental Nuclear Physics. Her passion for space applications began more than a decade ago, when she joined Airbus Defense and Space as System Engineer Radiation working for Artemis mission with ESA and NASA. Currently, Cristina's role is Radiation Hardness Assurance Engineer in ESA, supporting few science exploration, Space Weather and Earth Observation projects.
Abstract:
Radiation Hardness Assurance is a complex methodology, involving multiple disciplines, and relies on key pillars, as standardization and testing. An overview of the RHA concept will be presented, also as an evolution during various project phases. The ESA mission classification will be discussed. The tailored RHA approach will be illustrated as a function of mission class, for a CubeSat mission and for a more complex, Space Weather mission (Alpha Class).
Session 3: Board Level Testing
Daniel Söderström (CERN) and Richard Sharp (Radtest) - Session Chairs
Pictures coming soon.
Jeremy Myers (NASA)
Methodology and Results of a Cost-Effective Radiation Characterization of the Artemis Crew Imagery Handheld System
Bio:
Jeremy Myers is the NASA Marshall Space Flight Center Artemis Imagery Government Furnished Equipment (GFE) Lead. He has led development of various imagery systems for manned space flight including the Flight Imaging Lunch Monitoring Real-Time System (FILMRS) and the Handheld Universal Lunar Camera (HULC) both important systems used to capture imagery of the NASA Artemis Program. Mr. Myers leads a multi-disciplined team, through all aspects of design, build, and test of GFE. In so doing, he works with partners to help NASA develop cost effective solutions for human space flight.
Abstract:
As NASA return to the moon, and various companies and space agencies expand their sights to short duration lunar missions, the use of COTS (Commercial Off the Shelf) electronics and systems become more common. Such COTS components are already used in short duration low earth orbit missions, particularly in small satellites and cube sats. However, the susceptibility of these COTS systems to heavy ions and protons becomes more obvious during a lunar mission. Hence, these susceptibilities must be considered due to the damaging effects they can have on electronics and may impact the mission goals. Also, due to the challenge of obtaining beam time and the cost of using such facilities, an effective way of testing COTS systems is a critical part of the future of lunar missions. Therefore, a cost-effective methodology for testing COTS systems is beneficial to gain knowledge of the underlying susceptibilities of the parts that make up the system
In test and development of the Artemis Handheld Universal Lunar Camera (HULC) SEEs were quantified. The decision tree which was used to guide the project and mission managers will be presented. This included heavy ion beam time provided by the RADNEXT program. These findings were used to determine the modification needed in the HULC COTS Camera. The improvements to the system will be presented, along with the end results which was a robust imagery system that captured inspiring imagery from the Artemis II mission.
Pierre Garcia (TRAD)
Testing at board level: The Impact in Terms of Radiation Qualification and lessons learned
Bio:
I have been working at TRAD for 17 years, specializing in radiation testing. My experience covers various test campaigns, including TID, TNID, and SEE on several facility. I currently serve as the co-head of the Test Department.
Abstract:
In the context of NewSpace, Board Level Testing is a pragmatic alternative to traditional component-by-component qualification. Instead of testing every single chip, the entire functional board is exposed to radiation to validate its global behavior under mission-like conditions. This approach significantly reduces costs and lead times by focusing on the final application's resilience. However, its main drawback is diagnostic complexity: if a failure occurs, pinpointing the specific failing component within the complex system remains a major technical challenge.
Camille Bélanger-Champagne and Alex Hands (TRIUMF)
System-level Avionics Testing for Extreme Space Weather conditions
Bio:
Alex Hands and Camille Bélanger-Champagne coordinate the operations of PIF & NIF, the proton and neutron irradiation facilities at TRIUMF in Vancouver, Canada.
Abstract:
A subset of space weather events known as ground level enhancement (GLE) events can lead to very large enhancements in the atmospheric radiation environment experienced by commercial aircraft. In extreme cases, neutron fluxes may increase by several orders of magnitude at aircraft altitudes, leading to equivalent increases in single event effect (SEE) rates in aircraft electronics (avionics). Complex synergistic errors could arise that are not expected to occur when operating in typical atmospheric radiation conditions. Such space weather events cannot be predicted, shielded against or circumvented, therefore the best option for building resilience to their effects is through testing via recreation of the enhanced neutron environment. Although testing is routine to account for SEE caused by background galactic cosmic rays (GCR), there is currently no regulatory requirement for manufacturers to demonstrate survivability in GLE environments.
Canada’s TRIUMF laboratory has proton and neutron accelerated test facilities for studying SEE and other radiation effects in spacecraft and aircraft electronics. These are being developed for the specific purpose of enabling the study of SEE in avionics during extreme GLEs to help the aviation industry develop resilience to the most extreme space weather events.
Session 4: Wide-bandgap power devices for aerospace applications
Corinna Martinella (University of Montpellier) - Session Chair
Art Witulski (Vanderbilt University)
Single-Event Destructive Effects in Wide Bandgap High Voltage Power Devices in Space Environments
Bio:
Dr. Arthur Witulski received his B.S., M.S., and Ph.D. degrees from the University of Colorado at Boulder, where his graduate work was in modeling the static and dynamic performance of resonant power converters. He is currently a Research Professor in ECE at Vanderbilt University and a researcher at the Institute for Space and Defense Electronics (ISDE). His research interests include power electronics, power devices, and impacts of transistor-level radiation degradation on system performance. His power device interests include the effects of radiation on wide bandgap power devices such as silicon carbide and gallium nitride power transistors. He has been P.I. or Co-P.I. on many projects involving radiation effects on wide bandgap devices in the last decade, from both government and industry sponsors, including Co-P.I. of a NASA Early Stage Innovation (ESI) project on radiation effects on silicon carbide, and P.I of a NASA Lunar Surface Technology Research (LuSTR) silicon carbide radiation hardening program. He has also been P.I. of projects studying radiation effects on robots and satellites, and has worked with NASA Goddard to develop a model-based mission assurance platform that enables designers to track the effect of radiation-induced faults throughout a spacecraft electrical system
Abstract:
Wide bandgap (WBG) power devices, such as Gallium Nitride (GaN) and Silicon Carbide (SiC) power transistors and diodes are naturally suited to high voltage operation in electronic power conversion because of their high critical electric field, which enables power devices smaller than silicon, and with lower on-resistance. In the last decade, the power requirements for space applications have increased by about a factor of 100x due to more ambitious projects such as lunar exploration, asteroid resource extraction, space-based nuclear power generation, and possibly data centers in space. High electrical power conversion and transmission is handled more efficiently at high voltage, so there is a need for very efficient, high voltage power devices that can withstand the challenges of the space environment. Wide bandgap devices, especially silicon carbide, would seem to be the ideal technology to meet this need, but commercial SiC devices are vulnerable to single-event burnout (SEB) due to ions from cosmic rays and solar energetic particles. The drain voltage threshold for burnout in SiC devices is less than half of the rated drain voltage, which limits their use in space.
In this talk, we will discuss the main WBG power device technologies, the mechanisms for SEB in silicon and WBG devices, and models developed for analyzing and predicting SEB, especially regarding silicon carbide devices. We will also discuss two NASA programs for improving the SEB performance of WBG devices, the Lunar Science and Technology Research (LuSTR) grant focused on analysis of SEB mechanisms in SiC, from 2020 to 2023, and a new 2025 NASA program called SHIRE that is directed towards facilitating mass production of high-voltage SiC devices with high SEB thresholds. Both programs involve high-volume testing of SiC devices at ion accelerator facilities.
Joseph Kozak (Johns Hopkins University)
WBG Device Integration into a Deep-Space Rotorcraft
Bio:
Joseph P. Kozak received his B.S. and M.S degrees in Engineering Physics and Electrical Engineering from the University of Pittsburgh, and his Ph.D degree in Electrical Engineering from the Center for Power Electronic Systems (CPES) at Virginia Tech. Since 2021, he has been a senior electrical engineer, and serves as the Chief Technologist for the Spacecraft Power Engineering Group at Johns Hopkins Applied Physics Lab. Joseph’s primary role is supporting the NASA Dragonfly project as the lander battery lead engineer. He also supports the Lunar Surface Innovation Consortium (LSIC) Surface Power Focus Area, as well as various research and development projects and initiatives focusing around reliability of WBG semiconductors and their integration into high-reliability, power electronics applications.
Abstract:
The NASA Dragonfly mission, a rotorcraft destined for Saturn’s moon Titan, requires high-efficiency power electronics capable of operating in extreme deep-space environments. To meet the mission's stringent mass and efficiency constraints, the Rotor Drive Electronics (RDE) and the first-of-a-kind cooling fans utilize wide-bandgap (WBG) semiconductors—specifically Silicon Carbide (SiC) MOSFETs and Gallium Nitride (GaN) HEMTs—as primary power switching transistors.
This presentation summarizes the radiation-electrical stress characterization of these WBG devices. Multi-chip SiC MOSFET modules, rated at 900 V and 100 A, were subjected to heavy-ion stressors at Texas A&M and Michigan State University. Results indicate that while multi-chip modules offer slight improvements over single dies, they remain sensitive to Single-Event Effects (SEE). Notably, SiC MOSFETs exhibited increased drain and gate leakage currents and failed via Single-Event Burnout (SEB) at approximately 30% of their rated voltage (300–350 V) under mission-relevant stressors.
Complementary studies on GaN HEMTs (EPC7007) highlight their inherent resilience to Total Ionizing Dose (TID) due to the absence of a gate-oxide layer, though they remain susceptible to heavy-ion induced latent damage. Testing at the NASA Space Radiation Laboratory (NSRL) revealed an average SEB boundary of 225 V. Furthermore, irradiated GaN devices showed a reduction in instantaneous gate failure voltage compared to unstressed units, emphasizing the need for specialized derating protocols beyond traditional silicon standards like NASA EEE-INST-002. These findings establish critical operating margins and reliability data necessary for the successful flight of the Dragonfly rotorcraft in the high-radiation environment of space.
Simon Wainwright (Semi Zabala)
Radiation Hardened GaN Components for Space
Bio:
Dr. Simon P. Wainwright studied at the University of Liverpool and received his PhD on the topic of SOI. He was formerly the General Manager and VP of the HiRel Group, Microsemi (now Microchip). Co-Founder and CEO of Freebird Semiconductor Corporation (now EPC Space). After a period consulting on Automotive GaN with ViSIC Technologies Ltd he founded Semi Zabala SL a company whose goal is to produce discrete components and ICs using Wide Band Gap technologies in HiRel applications for Space using a fully European Supply Chain.
Abstract:
This work details the radiation results that were obtained from enhancement mode GaN HEMTs aimed for use in space applications. Both Single Event Effects and Total Ionizing Dose radiation effects were tested and the results will be shown in this work. It will be shown that depending on different design conditions the components can be made to not withstand any radiation, be tolerant to radiation and also to become radiation hardened up to elevated voltages of 600V. The applications of such technology will be presented along with the fully European based supply chain that is being developed. The goals of the two Horizon Europe programs alongside future work that is ongoing will also be discussed.
Ausias Garrigos Sirvent (Universidad Miguel Hernández)
SiC JFETs: Building blocks for radiation tolerant power applications
Bio:
Ausiàs Garrigós received his MSc in Electronic Engineering from the University of Valencia in 2000 and his PhD from Miguel Hernández University of Elche in 2007. He is currently a professor in the Department of Materials Science, Optics and Electronics Technology at Miguel Hernández University of Elche, where he is also a researcher in the Space Power and Electronics Systems Group. He undertook research periods at CERN in Geneva, Switzerland (from 2002 to 2004), at the European Space Research and Technology Centre of the European Space Agency in Noordwijk, the Netherlands (in 2008), and at the University of Strathclyde in Glasgow, UK (in 2015). His main research interests include space power electronics and ancillary electronic systems.
Abstract:
SiC JFETs have an attractive feature for use in resilient power electronics: they have no gate oxide structure, the origin of many reliability issues. In terms of radiation tolerance, SiC JFETs are not affected by threshold voltage drift (TID) or single event leakage current at low voltage (SELC I), both of which are key limiting factors. However, they are normally-on devices, requiring either a complete redesign of the gate driver or an additional control device in a configuration known as cascode, to convert them to normally-off devices. While the latter option requires two series power devices, it opens the door to many opportunities, as designers can use different power semiconductors as the control device, such as Si MOSFETs, GaN HEMTs and Si Schottky diodes, to create a variety of power devices. While the SiC JFET provides high-voltage blocking capability with low conduction losses, it is the low-voltage power device that defines the main functionality. Additionally, the series connection of JFETs using a single control device, usually referred to as 'supercascode', has applications in high-voltage systems. This presentation will present the results of various electrical endurance and radiation tests and introduce different configurations of cascode and supercascode power switches for various power processing functions, primarily focusing on the space power sector.
Session 5: Photonics
Andreas Pahler (University of Stuttgart)
Radiation Testing of Perovskite Sollar Cells
Bio:
Andreas Pahler is working at the Institute for Photovoltaics of the University of Stuttgart as a researcher on solar cells for space applications. With a Master’s degree in Aerospace Engineering, he specialized in the field of aerospace electronics and qualification during his PhD work at the Institute for Space Systems, University of Stuttgart. His experience covers the design and implementation of electronics for satellites, scientific ballooning, and sounding rockets, including several launch campaigns.
Abstract:
Perovskite solar cells are a promising emerging technology for solar power generation, offering extremely thin photoactive layers that enable flexible, lightweight photovoltaic devices with high mass-specific power. This makes them particularly suitable for new-space satellites, where strict constraints on mass, volume, and cost rule out traditional III-V space-grade solar cells.
Initial radiation studies on perovskite solar cells have shown encouraging results, but the long-term reliability and underlying physical mechanisms of radiation-induced effects remain largely unclear. This uncertainty is partly caused by the lack of standardized radiation test protocols tailored to thin-film solar cells, which exhibit different radiation susceptibilities compared to silicon and III-V technologies. The lack of a standardized test protocol further complicates comparison of literature, making it difficult or sometimes impossible
In this talk, we present recent radiation testing conducted at the Institute for Photovoltaics. We focus on practical approaches to testing PSCs, including the logistical challenges of handling devices that require a controlled atmosphere.
Session 6: Miscellaneous
Yashan Peng (JIACO Instruments)
Artifact-Free Decapsulation: Using Highly Selective Microwave Induced Plasma Etching
Bio:
Yashan Peng earned her master's degree in Materials Science and Engineering from Delft University of Technology in the Netherlands in 2020. After completing her studies, she joined Lam Research as field process engineer. She is now senior R&D process engineer at JIACO Instruments in the Netherlands, where she focuses on developing atmospheric pressure Microwave Induced Plasma (MIP) etching technology for decapsulation and delayering to support failure analysis.
Abstract:
Accurate Single Event Effect (SEE) characterization requires sample preparation that preserves the device’s original electrical characteristics and structural condition so that the measured response reflects its inherent SEE sensitivity. Any degradation of the die or bond wires during package removal can bias the SEE results. However, certain devices, such as those with high-Tg mold compounds, copper wires, silver wires, or PCB substrates, are particularly challenging for conventional decapsulation techniques, which often introduce unintended damage. For example, acid etching can cause wire thinning and bond pad corrosion, while CF₄-based vacuum plasma may result in die over-etching and ion bombardment damage.
This presentation discusses the use of atmospheric pressure Microwave Induced Plasma (MIP) as an alternative approach for artifact-free decapsulation. By employing neutral halogen-free radical species, the MIP technique provides highly selective removal of encapsulant materials while keeping the die surface and metal wires intact. As the MIP etching mechanism does not involve ion bombardment, the electrical functionality of the devices remains unaffected after decapsulation. This approach enables reliable front-side access to the device without introducing structural degradation or functional variation, thereby maintaining the validity of subsequent SEE characterization.
Juan Antonio Clemente (Universidad Complutense Madrid)
LELAPE: An open-source tool to classify SEUs according to their multiplicity in radiation-ground tests on memories
Abstract:
When researchers perform experiments on advanced SRAMs to assess their sensitivity against radiation, it is important to correctly classify the observed errors according to their multiplicity (Single Bit Upsets (SBUs), Multiple Cell Upsets (MCUs), etc). However, this might become a challenge in modern devices that implement mechanisms to detect and correct such errors (bit interleaving and Error Correcting Codes (ECC), amongst others). The reason is that this information is usually intellectual property (IP) of the manufacturers.
At G-RADNEXT 2026, I would like to present LELAPE, an easy-to-use tool developed that performs this classification automatically using statistical techniques. This tool takes as input one or several datasets obtained in radiation experiments and returns as output the list of events that were identified, without any limitation on the type of device (SRAMs, DRAMs, PSRAMs, FPGAs, etc...) or manufacturing technology (planar, FinFET, etc...). It has been made available to the Community through a Zenodo repository (https://zenodo.org/records/17617955) and protected by the European Union Public License (EUPL). This tool has much potential for facility users and researchers: It can easily and rapidly categorize multiple events observed in a radiation-ground experiment, making it convenient for optimizing beam time and analyzing devices whose internal structure is unknown for users, such as COTS memories and FPGAs.
Roberta Pilia (Thales Alenia space Italy)
Evaluation of neutron irradiation-induced displacement damage for Pressure Sensor
Bio:
I am Roberta Pilia, I am an electronic Engineer and I work as Radiation Effect Engineer for Thales Alenia Space. I work at project level for Thales Alenia Space and I follow all radiation related activity in terms of:
· Quality point of view: Radiation Control board
· Support to project in radiation technical aspect: (Radiation testing, impact at system level)
Abstract:
The importance to perform specific radiation testing is becoming more and more critical for Industry. Because of the fast technology evolution and miniaturization, it becomes crucial to develop test methodology, which are representative of the missions in terms of operation and radiation stress. In this context, an evaluation of neutron irradiation induced displacement damage of a Pressure sensor is presented. The component was a MicroElectroMechanical System (MEMS) commercial structure and it was irradiated at FNG facility. For this kind of devices, as the scale of this components diminish, they become potentially more sensitive to changes in their electrical and physical properties, induced by radiation. In this case, the devices was sensitive to gamma ray exposure and neutron testing aimed to study TNID effect in mission condition without dose deposition.
Martin Dentan (CERN)
The NERITA Project and its experiments supported by RADNEXT
Bio:
Dr Martin Dentan is a leading expert in electronics reliability in radiation environments, with a career at the French CEA since earning his PhD in 1989. From 1990 to 1998, he launched and led the DMILL project, developing a radiation‑hardened semiconductor technology used extensively in the ATLAS and CMS experiments at CERN’s LHC. From 1998 to 2002, he worked at CERN to establish and manage the ATLAS Policy on Radiation Tolerant Electronics, ensuring electronic system’s reliability. From 2002 to 2006, he served at the JET tokamak facility near Oxford, UK, supervising JET operations and co‑managing a high‑frequency deuterium ice‑pellet injector project. From 2008 to 2022, at ITER organization near Aix-en-Provence, France, he headed the Systems Engineering and Configuration Management section, then launched and led the ITER radiation‑hardness assurance program aimed at ensuring the reliability of all ITER electronics in its harsh radiation environment. Since 2023, he has returned to CERN to launch and lead NERITA, an international project aimed at ensuring the reliability of electronics exposed to neutron in tokamaks and accelerators.
Abstract:
Nuclear fusion facilities (e.g. tokamaks) and high-energy particle accelerators (e.g. Super Proton Synchrotron (SPS) or Large Hadron Collider (LHC) at CERN) employ a large number of Commercial Off The Shelf (COTS) electronic systems exposed to an artificial neutron environment which can cause Single Event Effects (SEEs) likely to impact their overall reliability and availability. Unfortunately, due to the absence of traceability of their constituent semiconductor components, the qualification or demonstration of reliability of COTS electronic systems in such artificial neutron environment is a particularly long, complex and expensive operation, which is not feasible with a large number of COTS electronic systems.
The NERITA Project aims at overcoming the need for qualification for SEEs induced by an artificial neutron environment, by replacing the qualification of electronic systems to neutron-induced SEEs with the adaptation and qualification of their artificial neutron environment with respect to SEEs induced by neutrons on general electronics.
The Project uses specific models and methods that have been validated by experiments conducted (i) in the neutron environment of tokamaks operated with DD and DT fusion plasmas, (ii) in neutron dominated fields of high-energy particles accelerators, and (iii) in facilities producing thermal and monoenergetic neutrons. These validated models and methods will be used to determine, through tests under thermal neutrons and mono-energetic neutrons, the parameters of the models describing the neutron SEE sensitivity of each of the components of a panel of elementary semiconductor components representative of general modern electronics. The resulting sets of parameters will make it possible to assess the reliability of any COTS electronic system in a defined artificial neutron environment (e.g. in a given location in a tokamak or in a particle accelerators) based on its reliability specified for the natural terrestrial environment, without doing neutron-SEE qualification tests (not feasible with a large number of COTS electronic systems).
The project will also provide the input data necessary for the precise design and optimization of global and local neutron shielding to meet defined reliability and availability requirements on COTS electronic systems without undersizing or oversizing the shields.
The Project, which primarily targets tokamaks and particle accelerators, is also potentially interesting for nuclear facilities such as nuclear fission power plants, neutron test facilities, nuclear medical facilities (because radiotherapy environments may include photoneutrons), etc.
Presentation about ENEA Frascati:
Rosaria Villari (ENEA)
R&D in Fusion Energy: The role and contributions of ENEA
Bio:
Rosaria Villari is Head of the DTT Division at ENEA, with over 20 years of experience in fusion neutronics for ITER, DEMO, JET, JT-60SA, DTT, and FNG. She leads the “Neutronics, Nuclear Waste, and Safety” sub-project within EUROfusion, supporting ITER nuclear operation preparation, and serves as Vice-Chair of the IEA Technology Collaboration Programme on Nuclear Technology of Fusion Reactors and STAC member of DONES. She is also Editor of Fusion Engineering and Design journal
Abstract:
Research and development in fusion energy aim to provide a safe, low-carbon, and virtually inexhaustible source of power by reproducing the processes that fuel the stars. Current efforts focus on addressing key scientific and technological challenges, including plasma confinement and stability, materials capable of withstanding extreme neutron fluxes, tritium breeding, neutronics, fuel cycle, and the integration of complex systems into reliable power plants. The ITER tokamak, currently under construction in France, represents the main international step toward demonstrating the feasibility of fusion energy through the integrated performance of plasma physics and reactor-relevant systems.
In this context, ENEA is a key contributor to fusion R&D within both European and international frameworks. The ENEA Nuclear Department is actively involved in the design, development, and testing of enabling technologies, including superconducting magnets, plasma-facing components, breeding blankets, remote handling systems, advanced materials, diagnostics, control and heating systems as well as on neutronics, safety and plasma physics. ENEA is also leading the development of major experimental infrastructures such as the Divertor Tokamak Test (DTT) facility, currently under construction in Frascati, which is specifically designed to address one of the most critical challenges for future reactors: power exhaust. DTT will investigate advanced divertor configurations and plasma regimes capable of handling the extreme heat and particle loads expected in fusion conditions, providing validated solutions for power dissipation and component protection in future devices. This activity builds on the experience gained from the Frascati Tokamak Upgrade and the earlier Frascati Tokamak.
ENEA also promotes technology transfer and industrial involvement, supporting the development of a high-tech supply chain in Italy and Europe. Through its multidisciplinary expertise and strong integration into international networks, ENEA contributes to bridging fundamental research and industrial deployment, accelerating progress toward the realization of fusion as a viable and sustainable energy source.
Andrea Colangeli (ENEA)
Overview of ENEA facilities in RADNEXT 2030
Bio:
Andrea Colangeli is an ENEA scientist since 2016 with a master degree in Nuclear Engineering and a Ph.D. in fusion neutronics. He has about ten years of experience in fusion neutronics, combining computational modelling and experimental activities within EUROfusion, F4E and ITER frameworks. He has contributed to neutronics studies for DEMO, ITER and JET, and has co-authored around 60 peer-reviewed publications. He is currently Instrument Scientist at the Frascati Neutron Generator (FNG), where he leads neutron physics experiments, and serves as ENEA scientific coordinator for the RADNEXT and RADNEXT-2030 project as well as Project Leader for neutronics in the Divertor Tokamak Test facility project.
Abstract:
The Italian National Agency for New Technologies, Energy and Sustainable Economic Development (ENEA) is a public research organization engaged in applied research, technological innovation and the development of advanced services in the fields of energy, environment and sustainable development.
Its infrastructure includes several research centers and large-scale laboratories equipped with irradiation facilities supporting both scientific research and industrial applications.
Within the framework of the RADNEXT-2030 project, four ENEA irradiation facilities are involved: the Frascati Neutron Generator (FNG), the Calliope gamma irradiation facility, the TOP-IMPLART proton accelerator and the REX electron accelerator.
FNG, already participating in RADNEXT since 2021, is a neutron source operating at 14 MeV and 2.45 MeV, with neutron yields up to 10¹¹ n s⁻¹ in DT mode. It is based on a linear electrostatic accelerator producing neutrons via D–T and D–D fusion reactions.
The Calliope facility, located at the ENEA Casaccia Research Centre, is a pool-type gamma irradiation system using ⁶⁰Co rods source with a mean photon energy of 1.25 MeV, licensed for 3.7x1015 Bq.
TOP-IMPLART is a proton irradiation facility in which the proton source is an RF pulsed linear accelerator with a maximum energy of 71 MeV. The proton beam is delivered in 2.5 us pulses of up to 10 uA peak current occurring every 40 ms.
REX is a 5 MeV S-band electron linear accelerator capable of delivering both electron and bremsstrahlung X-ray beams. The beam is produced in short pulses (~ 3 us) with a maximum repetition rate of 20 Hz.
This work presents the main characteristics, operational modes and application domains of these facilities, emphasizing their role and capabilities within the RADNEXT-2030 research infrastructure.