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09:30
Results on a beam test of n-in-p silicon strip sensors before and after irradiation
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Takuya Kishida
(Tokyo Institute of Technology (JP))
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09:55
Edge-TCT studies of heavily irradiated strip detectors
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Marko Milovanovic
(Jozef Stefan Institute, Ljubljana)
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10:20
Survey of Edge-TCT studies at CERN
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Irena Dolenc Kittelmann
(CERN)
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11:10
Update on charge collection measurements with SCT128 chip in Ljubljana
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Igor Mandic
(Jozef Stefan Institute (SI))
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11:35
Measurements of highly irradiated ATLAS n+-in-n planar pixel sensors
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Andre Rummler
(Technische Universitaet Dortmund (DE))
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12:00
Trench detectors for enhanced charge multiplication
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Gianluigi Casse
(University of Liverpool (GB))
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12:25
Radiation-hard active sensors in 180 nm HV CMOS technology
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Daniel Muenstermann
(CERN)