Jun 13 – 15, 2012
LAL Orsay
Europe/Paris timezone

Study of PPDs with multi-wavelength laser microscope system

Jun 13, 2012, 2:40 PM
Amphithéâtre Pierre Lehmann (LAL Orsay)

Amphithéâtre Pierre Lehmann

LAL Orsay

Centre Scientifique d'Orsay - Bat 200 91898 Orsay cedex FRANCE
Oral presentation SiPM


Koji YOSHIMURA (High Energy Accelerator Research Organization (KEK))


Measurement of PPD (Pixelated Photon Detector) characteristics with various wavelengths is important for understanding and improvement of the sensor performances. We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using OPO laser system. Laser spot can be focused to ~2 um, small enough to measure pixel-by-pixel performance of PPD. In this workshop, new multi-wavelength measurements of various types of PPDs using the laser microscope system will be reported.

Primary author

Koji YOSHIMURA (High Energy Accelerator Research Organization (KEK))


Isamu Nakamura (Department of Physics)

Presentation materials