-
3:10 PM
CMOS simulation and connection between device-level and electronics simulations
-
3:25 PM
Other detectors/technologies/activities
-
3:40 PM
Newly measured semiconductor properties
-
3:55 PM
Radiation damage: validation with measurements and development of high-fluence models
-
Marco Bomben
(APC & Université Paris Cité, Paris (FR))
-
4:10 PM
Time dependent electric/weighting field
-
4:25 PM
Simulation tools development