Jun 13 – 19, 2015
University of Alberta
America/Edmonton timezone
Welcome to the 2015 CAP Congress! / Bienvenue au congrès de l'ACP 2015!

Making and using atomically defined nanotips

Jun 17, 2015, 2:15 PM
CCIS L1-047 (University of Alberta)

CCIS L1-047

University of Alberta

Oral (Non-Student) / orale (non-étudiant) Instrumentation and Measurement Physics / Physique des instruments et mesures (DIMP-DPIM) W2-9 General Instrumentation and Measurement Physics (DIMP) / Physique générale des instruments et mesures (DPIM)


Radovan Urban (University of Alberta)


Atomically defined tips gained significant attention over the past decades to be used as gas field ion sources (GFISs) for helium ion microscopy (HIM) and non-staining ion beam writing applications, electron sources for high resolution SEM, TEM and electron holography, as well as scanning probe microscopy, namely STM and AFM. Single atom tips (SATs) represent a unique subgroup of atomically defined tips where nanotip apex is terminated by a single atom. In this presentation we will review field ion microscopy (FIM) technique to visualize individual surface atoms of sharp probes and discuss etching process to form atomically sharp nanotips. We will outline characterization methods to evaluate nanotip shape and performance as high brightness GFIS. We will also present scanning probe microscopy images demonstrating unique properties of single atom nanotips.

Primary author

Radovan Urban (University of Alberta)


Dr Jason Pitters (National Institute for Nanotechnology) Robert Wolkow (University of Alberta)

Presentation materials

There are no materials yet.