Impact of high-Z materials on electronic component hardness assurance in a mixed-radiation field

by Ruben Garcia Alia (Universite Montpellier II (FR))

Tuesday 13 Jan 2015, 09:00 → 10:00 Europe/Zurich

13/2-005 (CERN)

The use of Commercial-Of-The-Shelf (COTS) electronic components in the high energy accelerator context requires characterizing their response to radiation effects. Such a characterization is typically performed using one or several test beams which only cover a small subset of the particle species and energies present in the operational environment. In this seminar, we will describe the standard approach used to derive operational failure rates from test results, focusing on the effect of the strong energy dependency introduced by the presence of high-Z materials near the component's sensitive region.

Slides PH_seminar_Jan2015_RGA.pdf PH_seminar_Jan2015_RGA.pptx