Jun 5 – 10, 2016
Padova, Italy
Europe/Rome timezone

Automated Testing of MicroTCA.4 Modules

Jun 7, 2016, 3:00 PM
1h 30m
Centro Congressi (Padova)

Centro Congressi


Poster presentation New Standards Poster session 1


Dr Dariusz Makowski (Lodz University of Technology, Department of Microelectronics and Computer Science)


The Low Level Radio Frequency (LLRF) control system of the European X-Ray Free Electron Laser is designed using MicroTCA.4 standard. The real-time control system is composed of a few Advanced Mezzanine Cards (AMCs): timing, digitizer, digital controller and vector modulator modules. The DAMC-TCK7 digital controller module was developed as a high-performance low-latency data processing device. The DAMC-TCK7 card, based on Xilinx Kintex 7 FPGA device, provides all necessary resources required to implement the digital LLRF controller, i.e.: processing power, DRAM memory, flexible timing distribution and Rear Transition Module (RTM) controller. The module is equipped with various high-speed serial interfaces available on the AMC, Zone 3 connectors and front-panel that are capable of transferring data up to 12.5 Gbps each. More than 60 DAMC-TCK7 modules were fabricated for the XFEL accelerator. The manufactured modules should be carefully tested before they will be installed in the XFEL accelerator tunnel. A dedicated framework for automated testing of the DAMC-TCK7 modules was developed to simplify and accelerate the test procedure. This paper presents details of the automated test framework design and the results after tests of 60 DAMC-TCK7 modules. The framework is composed of a FPGA firmware, Linux driver and software that allows testing of all key components of the digital AMC module, like power supply, FPGA, memory, clock distribution, high-speed interfaces, IPMI controller and its sensors. The framework uses MMC (Module Management Controller) to verify the proper operation of power supply module, AMC and RTM management. The other modules are tested using the FPGA with dedicated firmware. As a result, a report in the PDF file format is generated.

Primary author

Dr Dariusz Makowski (Lodz University of Technology, Department of Microelectronics and Computer Science)


Mr Aleksander Mielczarek (Lodz University of Technology) Andrzej Napieralski (Technical University of Lodz) Holger Schlarb (DESY) Mr Michael Fenner (DESY) Mr Piotr Perek (Lodz University of Technology)

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