Speaker
Dr
Paul Sellin
(University of Surrey)
Description
The demand for new detector materials continues to develop, across a wide range
of applications including X-ray and synchrotron imaging, neutron detection, and
radiation hard tracking detectors. In this paper the current status of new
materials for semiconductor detectors will be reviewed, with a particular emphasis
on the requirements for imaging and pixellated devices. In the field of hard X-ray
and gamma ray imaging there has been continued improvement in the quality of
detector grade high-Z compound semiconductor materials such as CdTe and CdZnTe. The
availability of these materials, whilst still limited, continues to develop. There
has also been significant progress in the development of thick film polycrystalline
materials such as CdTe, PbO and HgI2 for applications as large area detector
layers, suitable for direct-deposition onto pixellated substrates. Single-crystal
synthetic diamond is another material that has developed rapidly, with high purity
diamond detectors now being developed for various applications in imaging,
dosimetry and radiation hard tracking detectors. In this talk I will review these
various candidate materials and discuss their application for the next generation
of position sensitive detectors.
Primary author
Dr
Paul Sellin
(University of Surrey)
