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12-16 September 2005
University of Liverpool
Europe/Zurich timezone

Laser Tests Of Silicon Strip Detectors

15 Sep 2005, 10:30
45m
University of Liverpool

University of Liverpool

Greenbank Conference Park
Board: P2
Contributed Poster Pixel Detectors for Charged Particles P : Coffee and Poster Session

Speaker

Dr Peter Kodys (Institute of Particle and Nuclear Physics, Charles University)

Description

This presentation collects experiences from tests of ATLAS end cap SCT modules using infrared semiconductor laser on 1060 nm wavelenght. Sophisticated method of focusing was developed. Timing and interstrip properties of modules were measured. Tests of silicon sensors simulate real experimental conditions and check important detector properties. Laser tests have good time and space description, but photons generate electron-hole pairs in silicon bulk via different mechanism. Detailed discusion about usability of laser test for particle detectors is presented. Laser tests are extremely useful for tuning individual sensor and readout settings to find optimal working parameters. Furthermore they are good for comparison between the same type of detectors with exactly the same top surface properties.

Primary author

Dr Peter Kodys (Institute of Particle and Nuclear Physics, Charles University)

Presentation materials