Feb 22 – 24, 2016
LPNHE
Europe/Zurich timezone

Reverse bias current characterisation of silicon strip sensors and shallow radiation damage generation

Feb 23, 2016, 12:00 PM
20m
Amphitheatre de recherche George Charpak (LPNHE)

Amphitheatre de recherche George Charpak

LPNHE

4 Place Jussieu 75005 - Paris FRANCE

Speaker

Sven Wonsak (University of Liverpool (GB))

Presentation materials