Speaker
Mr
Apiwat Boonkhuang
(Khon Kaen University)
Description
Sb-single doped rutile-TiO$_2$ (STO) ceramics were prepared by a conventional mixed oxide method. The high-dielectric performance with giant dielectric constant value ($\epsilon$'$\approx$10$^4$) with low dielectric loss (tan$\delta$<0.05) of STO ceramics over a wide temperature range were obtained. Scanning electron microscope coupled with energy-dispersive X-ray analysis (EDX) and X-ray diffraction technique were used to characterize the microstructure and crystal structure, respectively. The existence of Ti$^{3+}$ was confirmed using X-ray photoelectron (XPS) technique. X-ray absorption near edge structure (XANES) technique were also carried out. The origin of the observed high-dielectric performance in STO ceramics was investigated.
Primary authors
Mr
Apiwat Boonkhuang
(Khon Kaen University)
Dr
Prasit Thongbai
(Khon Kaen University)
Dr
Pinit Kidkhunthod
(Synchrotron Light Research Institute)
Dr
Narong Chanlek
(Synchrotron Light Research Institute)
