Speaker
Dr
SUSUMU KATO
(National Institute of Advanced Industrial Science and Technology(AIST))
Description
Many optical elements such as mirror, window, amplifier, and wavelength conversion elements are made from oxide materials. The elucidation of damage threshold and mechanism is indispensable to the development of high-power system. Especially, in high-repetition-rate system, the accumulation of defects such as color center causes the damage.
In this work, we propose a kinetic model including generation from excited state to defect in oxide crystals and evaluate the influence of defects accumulation on crystal damage.
| session | Modelling and Simulations |
|---|---|
| Type of contribution | Poster |
Primary author
Dr
SUSUMU KATO
(National Institute of Advanced Industrial Science and Technology(AIST))
Co-author
Dr
ATSUSHI SUNAHARA
(Institute for Laser Technology(ILT))
