9-15 June 2018
Woodlands Conference Center
America/New_York timezone
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Application of FPGA Acceleration in ADC Performance Calibration

12 Jun 2018, 14:40
1h 30m
Woodlands Conference Center

Woodlands Conference Center

159 Visitor Center Dr, Williamsburg, VA 23185
Poster presentation Processing Farms Poster 1

Speaker

Mr Guangyuan yuan (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China ;Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China)

Description

In recent years, high speed and high resolution analog-to-digital converter (ADC) is widely employed in many physical experiments, especially in high precision time and charge measurement. The rapid increasing amount of digitized data demands faster computing. FPGA acceleration has an attracting prospect in data process for its stream process and parallel process feature. In this paper, an ADC performance calibration application based on FPGA acceleration is described. FPGA reads the ADC digitized data stream from PC memory, process and then write processed data back to the PC memory. PCIE bus is applied to increase the data transfer speed, and floating point algorithm is applied to improve the accuracy. The test result shows that FPGA acceleration can reduce the processing time of the ADC performance calibration compared with traditional method of C-based CPU processing. This frame of PCIE-based FPGA acceleration method can be applied in analysis and simulation in the future physical experiment for large ADC array, such as CCD camera and waveform digitization readout electronics calibration.

Speaker Guangyuan yuan
Description ADC calibration Algo
Country China
Minioral Yes
Institute USTC

Primary authors

Mr Guangyuan yuan (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China ;Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China) Dr Zhe Cao (1 State Key Laboratory of Particle Detection and Electronics (IHEP-USTC), Hefei, 230026, China; 2 Department of Modern Physics, University of Science and Technology of China, Hefei, 230026, China) Mr Shuwen Wang (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China;Department of Modern Physics, University of Science and Technology of China, Hefei, 230026, China) Mr Yanbin Shui (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China;Department of Modern Physics, University of Science and Technology of China, Hefei, 230026, China) Mr Xing Zhu (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China;Department of Modern Physics, University of Science and Technology of China, Hefei, 230026, China) Prof. Shubin Liu (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China; Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China) Prof. Qi An (State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China;Department of Modern Physics, University of Science and Technology of China, Hefei, 230026, China)

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