3–7 Apr 2017
University of Birmingham
Europe/London timezone

Minimum bias and underlying event measurements with CMS

5 Apr 2017, 11:20
20m
Small Lecture Theatre, Poynting Building

Small Lecture Theatre, Poynting Building

WG2) Low x and Diffraction WG2 Low x and Diffraction

Speaker

Benoit Roland (Deutsches Elektronen-Synchrotron (DE))

Description

We present results on the measurement of the underlying event at 13 TeV using leading tracks, jets, and Drell-Yan processes. In addition measurements of forward-backward particle correlations and the rapidity gap fraction are presented. Finally results on charged particle multiplicity and transverse momenta distributions are shown.

Presentation materials