Studies of uniformity of 50 um UFSD sensors at the Fermilab test beam

10 Dec 2017, 21:12
1m
Conference Center (Okinawa Institute of Science and Technology Graduate University (OIST))

Conference Center

Okinawa Institute of Science and Technology Graduate University (OIST)

OIST, Onna, Okinawa 904-0495, Japan
POSTER New ideas and future applications POSTER

Speaker

Artur Apresyan (Fermi National Accelerator Lab. (US))

Description

We report measurements of uniformity of time resolution, signal
amplitude, and charged particle detection efficiency across the sensor surface
of Ultra-Fast Silicon Detectors (UFSD). Comparisons of performance of sensors
with different doping concentrations, and different active thicknesses are
presented, as well as their temperature dependance and radiation tolerance up to
$6\times 10^{14}$~n/cm$^2$. Results were obtained during Spring 2017 campaign at the Fermilab test beam
facility using 120 GeV proton beams, and a high precision pixel tracking
detector. UFSD sensors based on the Low-Gain Avalanche Detector (LGAD) design
were manufactured by the the Centro Nacional de Microelectr`onica (CNM) and
Hamamatsu Photonics (HPK) were tested in the experiments. The uniformity of the
sensor response in pulse height, efficiency and timing resolution were found to
be good pre-radiation, with time resolution around 30-40 psec depending on
operating conditions. A ``no-response'' area between pads which exhibitwas
measured to be around 70~$\mu$m for CNM and 110$\mu$m for HPK sensors. After a
neutron fluence of $6\times 10^{14}$~n/cm$^2$ the CNM sensor exhibits a large
gain variation of a factor 2.5 when comparing metallized and non-metallized
sensor areas. Irradiated CNM sensor achieved time resolution of 30~psec for the
metallized part, and 40~psec for the non-metallized area, while the time
resolution of the HPK sensor was measured to be 30~psec.

Primary authors

Artur Apresyan (Fermi National Accelerator Lab. (US)) Si Xie (California Institute of Technology (US)) Cristian Ignacio Pena Herrera (California Institute of Technology (US)) Nicolo Cartiglia (INFN Torino (IT)) Hartmut Sadrozinski (SCIPP, UC santa Cruz) Patrick Freeman (University of California Santa Cruz) Nicola Minafra (The University of Kansas (US))

Presentation materials