Feb 20 – 22, 2017
FBK, Trento
Europe/Zurich timezone

Measurements of passive structures on irradiated HV-CMOS detectors

Feb 21, 2017, 10:05 AM
20m
Aula Grande (FBK, Trento)

Aula Grande

FBK, Trento

Via Santa Croce, 77 38122 Trento ITALY

Speaker

Bojan Hiti (Jozef Stefan Institute (SI))

Description

Results of an irradiation study on full scale HV-CMOS demonstrator chips will be presented. Samples were characterised using Edge-TCT and Sr90 measurement methods. With Edge-TCT the depleted depth was estimated for different substrate resistivities and neutron fluences. The study was complemented with measurements of charge deposited by MIPs from a Sr90 source. All measurements were performed on passive test structures using an external amplifier.

TRACK CMOS Sensors

Primary author

Bojan Hiti (Jozef Stefan Institute (SI))

Co-authors

Andrej Gorisek (Jozef Stefan Institute (SI)) Gregor Kramberger (Jozef Stefan Institute (SI)) Igor Mandic (Jozef Stefan Institute (SI)) Marko Mikuz (Jozef Stefan Institute (SI)) Marko Zavrtanik (Jozef Stefan Institute (SI)) Vladimir Cindro (Jozef Stefan Institute (SI))

Presentation materials