Sep 3 – 8, 2017
The Open University, Milton Keynes, UK.
Europe/London timezone

Chromatic X-ray imaging with a fine pitch CdTe sensor coupled to a large area photon counting pixel ASIC

Sep 4, 2017, 11:00 AM
Berill Lecture Theatre (OU)

Berill Lecture Theatre (OU)

The Open University, Walton Hall, Milton Keynes, MK7 6AA


Ronaldo Bellazzini (INFN Pisa)


An innovative X-ray imaging sensor based on Chromatic Photon Counting technology
with intrinsic digital characteristics is presented. The system counts individually the incident X-ray photons and selects them according to their energy to produce two color images per exposure. The energy selection occurs in real time and at radiographic imaging speed (GHz global counting rate).
Photon counting, color mode and a very fine spatial resolution (more than 10 LP/mm at MTF50) allow to obtain a high ratio between image quality and absorbed dose. The individual building block of the imaging system is a two-side buttable semiconductor radiation detector made of a thin pixellated CdTe crystal coupled to a large area VLSI CMOS pixel ASIC. Modules with 1, 2, 4, and 8 block units have been built. The largest module has 25x2.5 cm2 sensitive area. Results and images obtained from testing different modules are presented.

Primary authors

Ronaldo Bellazzini (INFN Pisa) Gloria Spandre (INFN Sezione di Pisa (INFN)) Alessandro Brez (INFN Sezione di Pisa (INFN)) Massimo Minuti (INFN) Michele Pinchera

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