24-28 June 2018
Sundsvall
Europe/Zurich timezone

Lab and Test Beam Results of Irradiated Silicon Sensors with Modified ATLAS Pixel Implantations

27 Jun 2018, 11:10
20m
Quality Hotel, Folkets Hus (Sundsvall)

Quality Hotel, Folkets Hus

Sundsvall

Esplanaden 29 Sundsvall, Sweden
Oral Oral

Speaker

Mareike Weers

Description

The inner detector of the ATLAS experiment consists of a pixel detector, a strip detector and the transition radiation tracker. During the Phase-0 upgrade in 2013 the Insertable B-Layer (IBL) with a new beam pipe was added as the innermost layer. The planar pixel sensors of the IBL are produced in n$^+$-in-n technology and have a pitch of $250\,\mu$m $\times$ $50\,\mu$m. The pixel design of these sensors with a rectangular n$^+$-implant are the baseline for modified pixel designs which were developed in Dortmund.
Different implantation shapes are designed to cause electrical field strength maxima to achieve an increased charge collection after irradiation and thus higher particle detection efficiencies at lower operation voltages.
To test and compare the different pixel designs, all six modified pixel designs and the standard IBL design are placed on one sensor. With individual guard rings and separated high voltage pads on the p-side of the sensor, any pixel design matrix can be depleted separately. These sensors can be read out with FE-I4 read out chips.
Several sensors have been irradiated with protons or neutrons in irradiation test facilities to simulate the radiation damage. In this way the influence of the pixel design on the sensor performance after irradiation can be investigated.
Test beam measurements provide an environment close to the real operating conditions in the detector because the sensor detects charged particles with high energies. With the results of test beam measurements advanced sensor properties like charge collection efficiency and track recognition efficiency can be examined. The tracks are measured with a Mimosa26 telescope and reconstructed with the EUTelescope software. The sensor properties are analyzed with TBMon2.
Basic sensor characterization like IV measurements and source scans are performed in the lab.
In this talk, lab measurements of these prototype sensors are presented. Results of test beam measurements complete the characterization of the different pixel designs.

Primary author

Mareike Weers

Co-authors

Silke Altenheiner (Technische Universitaet Dortmund (DE)) Andreas Gisen (Technische Universitaet Dortmund (DE)) Valerie Vanessa Hohm (Technische Universitaet Dortmund (DE)) Kevin Alexander Kroeninger (Technische Universitaet Dortmund (DE)) Anna-Katharina Raytarowski (Technische Universitaet Dortmund (DE)) Jens Weingarten (Georg August Universitaet Goettingen (DE))

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