LIU-PS Beam Dynamics WG meeting #17 - Emittance growth due to misteering and evolution at flat-bottom; KFA45 post-pulse ripple; PSB-to-PS dedicated MDs; High-intensity tests with 25 ns LHC-type beam; Status of PS turn-by-turn SEMgrid measurements
Thursday 7 June 2018 -
14:00
Monday 4 June 2018
Tuesday 5 June 2018
Wednesday 6 June 2018
Thursday 7 June 2018
14:00
Introduction
-
Heiko Damerau
(
CERN
)
Alexander Huschauer
(
CERN
)
Matthew Alexander Fraser
(
CERN
)
Introduction
Heiko Damerau
(
CERN
)
Alexander Huschauer
(
CERN
)
Matthew Alexander Fraser
(
CERN
)
14:00 - 14:10
Room: 864/2-B14 - SALLE J.B.ADAMS
14:10
Updates on studies of transverse emittance blow-up due to misteering and evolution along the flat-bottom
-
Eugenio Senes
(
University of Oxford (GB)
)
Updates on studies of transverse emittance blow-up due to misteering and evolution along the flat-bottom
Eugenio Senes
(
University of Oxford (GB)
)
14:10 - 14:25
Room: 864/2-B14 - SALLE J.B.ADAMS
14:25
Beam based measurement of the KFA45 post-pulse ripple
-
Eugenio Senes
(
University of Oxford (GB)
)
Beam based measurement of the KFA45 post-pulse ripple
Eugenio Senes
(
University of Oxford (GB)
)
14:25 - 14:35
Room: 864/2-B14 - SALLE J.B.ADAMS
14:35
First results of PSB-to-PS transfer dedicated MDs
-
Vincenzo Forte
(
CERN
)
Matthew Alexander Fraser
(
CERN
)
First results of PSB-to-PS transfer dedicated MDs
Vincenzo Forte
(
CERN
)
Matthew Alexander Fraser
(
CERN
)
14:35 - 14:50
Room: 864/2-B14 - SALLE J.B.ADAMS
14:50
High intensity tests with 25 ns LHC-type beam
-
Heiko Damerau
(
CERN
)
High intensity tests with 25 ns LHC-type beam
Heiko Damerau
(
CERN
)
14:50 - 15:05
Room: 864/2-B14 - SALLE J.B.ADAMS
15:05
AOB: Status of PS turn-by-turn SEMgrids measurements (reliability run, usage of the present electronics for turn-by-turn measurements, status of the new turn-by-turn electronics development)
-
Frank Tecker
(
CERN
)
Matthew Alexander Fraser
(
CERN
)
Federico Roncarolo
(
CERN
)
AOB: Status of PS turn-by-turn SEMgrids measurements (reliability run, usage of the present electronics for turn-by-turn measurements, status of the new turn-by-turn electronics development)
Frank Tecker
(
CERN
)
Matthew Alexander Fraser
(
CERN
)
Federico Roncarolo
(
CERN
)
15:05 - 15:35
Room: 864/2-B14 - SALLE J.B.ADAMS
- Reliability run results on kickers pulses for beam destruction (M. Fraser, 10 mins) - Usage of the present electronics for turn-by-turn measurements (F. Tecker, 10 mins) - Status of the new turn-by-turn electronics development (F. Roncarolo, 10 mins)