Metal Whiskering is a phenomenon occurring in electrical devices when whisker-like extrusions are forming from metal during the time, they look like small metal hairs or tendrils. This phenomenon was noticed in a vacuum tube for tin, and for other metals like zinc, cadmium and even lead. Whiskers growing between metal solder pads causing short circuits.
Investigation of the metal whiskering occurring on small electric samples by the X-ray imaging and tomography utilizing large area Timepix detector will be presented within this work. Large area detector installed in the institute of experimental and Applied Physics consists of 25 Timepix chips with silicon sensor and 500µm thickness.
The detector is a useful tool for small samples like whiskers which have a diameter around 5 m and longitude in the range 10-1000 m, therefore spatial resolution around 1 m is required.