The aim of the report is to present the surface characterization techniques available within the framework of the Nano-laboratory building at the FLNR, JINR. The laboratory provides state-of-the-art spectroscopy and microscopy instrumentation for research on the application of heavy-ion beams in the field of nanotechnology and materials science. The techniques available include coupled confocal Raman spectroscopy-scanning probe microscopy (STM, AFM), X-ray photoelectron spectroscopy, Auger electron spectroscopy, and Fourier transform infrared spectroscopy. The results will be presented on the example of various carbon-based materials irradiated with heavy ions in the keV to GeV energy range. A possible extension of the work reported would be to study the effects induced by slow highly charged ion beams. Such beams can be produced by electron cyclotron resonance ion sources at the FLNR or electron string ion sources developed for the NICA injection facility.