Oct 14 – 17, 2019
Siena (Italy)
Europe/Zurich timezone

Radiation induced degradation in a 150‐nm CMOS SPADs device

Oct 16, 2019, 9:50 AM
15m
Siena (Italy)

Siena (Italy)

Speaker

marcello campajola (INFN and University of Naples "Federico II")

Presentation materials