Articles related to the presentation follow:

• P. M. O’Neill, G. D. Badhwar, W. X. Culpepper, "Risk assessment for heavy ions of parts tested with protons", IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 23112314, Dec. 1997.
  • https://ieeexplore.ieee.org/document/659052
  • Foundational reference / origin
• D. M. Hiemstra, E. W. Blackmore, "LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics", IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 22452250, Dec. 2003.
  • https://ieeexplore.ieee.org/document/1263867
• R. Ladbury, J.M. Lauenstein, K. P. Hayes, "Use of proton SEE data as a proxy for bounding heavy-ion SEE susceptibility", IEEE Trans. Nucl. Sci., vol. 62, no. 6, pp. 25052510, Dec. 2015.
  • https://ieeexplore.ieee.org/document/7348792
• R. L. Ladbury and J.M. Lauenstein, "Evaluating Constraints on Heavy-Ion SEE Susceptibility Imposed by Proton SEE Testing and Other Mixed Environments," in IEEE Trans. Nucl. Sci., vol. 64, no. 1, pp. 301308, Jan. 2017.
  • https://ieeexplore.ieee.org/document/7790816
  • One of the most recent critiques that went through peer review