24–29 May 2020 Postponed
America/Vancouver timezone

NanoRadMet: Development of Multi-Purpose, Low Mass, Beam Profile Monitors by Nanometric Metal Films Deposition

28 May 2020, 16:18
18m
Parallel session talk Technology Transfer Technology Transfer

Description

In the IRRAD Facility at CERN, radiation hardness tests are performed using a high intensity 24 GeV/c proton beam. Over one year, the total accumulated particle fluence exceeds 1e18 p/cm2, which represents a challenge for the beam monitoring instrumentation. During the 2014-2018 run, PCBs patterned with a matrix of sensing pixels were used as Secondary Electron Emission (SEE) Beam Profile Monitors (BPMs). To improve their radiation tolerance, a EU-funded R&D project (ATTRACT NanoRadMet) is ongoing, to manufacture new BPMs by sputtering and evaporation of metal films at the nanometer scale. The reduction in metal thickness minimizes the beam interaction and opens the possibility to monitor also low-energy charged beams such as the ones used in medical applications. We report here about the fabrication of different BPM prototypes, made of Aluminium deposited on Silicon and Polyimide substrates, and their characterization with a 200 MeV electron beam at the CERN CLEAR facility.

Funding information European Union ATTRACT project

Primary authors

Isidre Mateu (CERN) Federico Ravotti (CERN) Giuseppe Pezzullo (CERN) Viktoria Meskova (Democritus University of Thrace (GR)) Blerina Gkotse (Mines ParisTech (FR)) Antonio Gilardi (Universita e sezione INFN di Napoli (IT)) Wilfrid Farabolini (Université Paris-Saclay (FR)) Prof. Jean-Michel Sallese (Ecole Polyechnique Federale de Lausanne) Mr Didier Bouvet (Ecole Polytechnique Federale de Lausanne) Prof. Mikko Ritala (University of Helsinki)

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