12–14 Nov 2007
CERN
Europe/Zurich timezone

TCT and CCE measurements for 9 MeV and 24 GeV/c irradiated n-type MCz-Si pad detectors

12 Nov 2007, 15:50
20m
40-S2-C01 (CERN)

40-S2-C01

CERN

Defect Engineering and Pad Detector Characterization Pad Detector Characterization & Defect Engineering

Speaker

Dr Jaakko Haerkoenen (Helsinki Institute of Physics HIP)

Description

N-type MCz-Si pad detectors have been irradiated by 9 MeV and 24 GeV/c protons up to 1x10^16 neff/cm^2 fluence. The samples have been characterized by Transient Current Technique (TCT) operating with 670nm laser and Charge Collection Efficiency (CCE) measurements performed by 1060nm IR laser. Low and high energy proton irradiation results are compared and charge collection of MCz-Si detectors is discussed.

Primary author

Dr Jaakko Haerkoenen (Helsinki Institute of Physics HIP)

Co-authors

Dr Eija Tuominen (Helsinki Institute of Physics HIP) Mr Esa Tuovinen (Helsinki Institute of Physics HIP) Dr Panja Luukka (Helsinki Institute of Physics HIP) Dr Sandor Czellar (Helsinki Institute of Physics HIP)

Presentation materials