Speaker
Philip Eib
(UNISERS)
Description
As semiconductor feature sizes decrease, controlling contamination in manufacturing processes becomes increasingly important. UNISERS builds tools for contamination detection and classification using a unique combination of optical microscopy and Raman spectroscopy, quantifying contaminants on wafers and in liquids. This talk highlights our techniques and their applications, while giving insight into a workplace for physicists at the intersection of fundamental physics, data science, and product development.
Author
Philip Eib
(UNISERS)
