DT Training Seminars

Beam Profile Monitors based on thin-film nanolayers for the IRRAD Proton Facility

by Ourania Sidiropoulou (CERN)

Europe/Zurich
CERN

CERN

Description

The Beam Profile Monitor (BPM) devices for the CERN proton IRRADiation facility are the key system to steer and align the beams operated in the T8 beam-line of the PS East Area. These devices feature a matrix of metallic sensing pads. When exposed to primary irradiation beams, secondary electrons are emitted from each pad generating a charge proportional to the impinging particle flux, thus allowing to reconstruct the beam profile in several locations in IRRAD. The BPM devices used in IRRAD until 2018 were based on the standard PCB technology. After five years of operation in a harsh radiation environment, these devices showed some drawbacks (radiation damage, high induced radioactivity, etc.).  In addition, with the evolution of the requirements for the new IRRAD facility (need for higher sensitivity, lower material budget, etc.) the development of new devices became mandatory. In this seminar, new BPM devices based on micro-fabrication technology will be presented. After one year of R&D, in the context of the EU-funded ATTRACT phase I project NanoRadMet, several prototypes were manufactured following different approaches, and tested with 200 MeV electrons at the CERN CLEAR facility. Finally, this led to the choice of BPM sensors made of hundreds nm of Al deposited on thin Kapton foils for the upcoming IRRAD runs.