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LHC Beam Operation Workshop - Evian 7-9 December 2010

7–9 Dec 2010
Hilton, Evian
Europe/Zurich timezone

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Session

Session 3: Beam diagnostics and feedback systems

8 Dec 2010, 11:00
Hilton, Evian

Hilton, Evian

Description

Chair: Jörg Wenninger; Scientific Secretary: Reyes Alemany

Presentation materials

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  1. 25. Bunch by bunch beam instrumentation
    T. Lefevre
    08/12/2010, 11:00
    This talk describes the LHC bunch by bunch beam instrumentation. The status of all the different systems are reviewed: Wire scanner, Synchrotron light monitor, Beam Position monitor, Schottky monitor, BCT, Wall current monitor, Longitudinal density monitors and Luminosity monitors. The achieved performances in 2010 and the already known limitations of both the hardware and the software will...
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  2. 26. Feedbacks: status, operational dependencies and outlook for 2011
    R. Steinhagen
    08/12/2010, 11:30
    The tune measurement and FB saga. PLL as workhorse for 2011? FB and transverse FB. Q' FB - shall we modulate in every fill?  Orbit FB: improvements for 2011.
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  3. 28. Transverse damper operation
    W. Hofle
    08/12/2010, 12:00
    Observations vs expectations
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  4. 27. BPM: status, measurement reliability and outlook for 2011
    E. Calvo
    08/12/2010, 12:20
    This talk will present an overview of the performance of the LHC Beam Position System during 2010. Its dependence to beam intensity and surface rack temperature variations are discussed in more details. The modifications currently envisaged to improve the present system will be finally presented.
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  5. 29. Can we get a reliable on-line measurements of the transverse beam size?
    F. Roncarolo
    08/12/2010, 12:40
    The transverse beam emittances of the LHC proton and ion beams can be inferred by measuring the beam sizes with Wire Scanner (WS), Synchrotron Radiation (BSRT) and Beam Gas Ionization (BGI) monitors. This presentation covers all aspects related to the operation of such devices in 2010 with a particular emphasis on the monitors performance with respect to their design specifications and...
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