Speaker
Prof.
Juozas Vaitkus
(Vilnius University)
Description
A new series of diodes FZ-Si (Hamamatsu) investigated by: 1) a standar technique (I(V) and C(V)); 2) by microwave photoconductivity decay measurement; 3) the response on the linear front bias pulse technique (BELIV); 4) the photoconductivity specra in the extrinsic region. Measurements performed at room a tat low temperature. The results are compared with the similar measurements in other supplier and in irradiated samples.
Author
Prof.
Juozas Vaitkus
(Vilnius University)
Co-authors
Mr
Arunas Velicka
(Vilnius University)
Mr
Aurimas Uleckas
(Vilnius University)
Dr
Eugenijus Gaubas
(Vilnius University)
Mr
Jurij Kusakovskij
(Vilnius University)
Mr
Kestutis Zilinskas
(Vilnius University)
Mr
Neimantas Vainorius
(Vilnius University)
Mr
Tomas Ceponis
(Vilnius University)
Prof.
Vaidotas Kazukauskas
(Vilnius University)
