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Technical Seminar
Plasma Diagnostics of ECR Ion Sources
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Europe/Zurich
26-1-022 (CERN)
26-1-022
CERN
Description
Development of Electron Cyclotron Resonance Ion Sources (ECRIS) beyond the state-of-the-art calls for deeper understanding of the complex processes occurring in the ECRIS plasma. A prime example is predicting the x-ray heat load of the cryostat in superconducting ion sources, requiring exact knowledge about the electron heating mechanism.
Recent efforts by the JYFL ion source group have concentrated on ECRIS plasma diagnostics in pulsed operation mode of the ion sources. Although ECR ion sources are typically operated in continuous mode, plasma diagnostics in pulsed operation have revealed substantial amount of new information about the plasma breakdown and decay processes helping us to understand the physics of steady state ECRIS plasmas.
An overview of ECRIS plasma diagnostics in pulsed operation mode will be presented. The experimental techniques discussed include x-ray spectroscopy, plasma diamagnetism diagnostics and plasma potential measurements. The plasma-microwave coupling during the breakdown is also discussed.
Extending the plasma diagnostics capabilities with visible and VUV-light spectroscopy is expected in nearby future. Some results obtained with an overdense microwave ion source and a brief discussion on the prospects of these methods for ECRIS plasma diagnostics will be presented.
Recent efforts by the JYFL ion source group have concentrated on ECRIS plasma diagnostics in pulsed operation mode of the ion sources. Although ECR ion sources are typically operated in continuous mode, plasma diagnostics in pulsed operation have revealed substantial amount of new information about the plasma breakdown and decay processes helping us to understand the physics of steady state ECRIS plasmas.
An overview of ECRIS plasma diagnostics in pulsed operation mode will be presented. The experimental techniques discussed include x-ray spectroscopy, plasma diamagnetism diagnostics and plasma potential measurements. The plasma-microwave coupling during the breakdown is also discussed.
Extending the plasma diagnostics capabilities with visible and VUV-light spectroscopy is expected in nearby future. Some results obtained with an overdense microwave ion source and a brief discussion on the prospects of these methods for ECRIS plasma diagnostics will be presented.