Sep 25 – 29, 2006
Relais San Clemente, Perugia (ITALY)
Europe/Zurich timezone
The Registration if for invited person only

Total Ionizing Dose Effects in 130-nm Commercial CMOS Technologies for HEP experiments

Sep 26, 2006, 9:00 AM
30m
Relais San Clemente, Perugia (ITALY)

Relais San Clemente, Perugia (ITALY)

Perugia (ITALY)

Speaker

Mr Simone Gerardin (INFN Padova)

Primary author

Mr Simone Gerardin (INFN Padova)

Presentation materials