Introduction

• Daisuke Kobayashi (ISAS/JAXA)
• Ruben Garcia Alia (CERN)

Part I: Galactic Cosmic-Ray SEE Testing

• Takahiro Makino (QST)

Japan has many accelerator facilities, but only a few beam lines are available for the high LET Galactic Cosmic-Ray testing for SEE. Takasaki Ion Accelerator for Advanced Radiation Application (TIARA) has some specialized beam lines for SEE testing. Broad beam irradiation lines from a K=110 MeV AVF cyclotron and a micro-beam line from a 3-MV tandem accelerator are available for the testing and used for a long time in Japan as leading facilities. Specifications of the beam lines and their target chambers as well as some results from experiments on the beam lines will be given in the talk. In addition, application of high energy ions from the synchrotron that can penetrate completely thick devices such as power MOSFETs will be shown.

Q&A section

Part II: Terrestrial Cosmic-Ray SEE Testing

• Masanori Hashimoto (Kyoto University)

This talk introduces the characterization of soft error rate in terrestrial environment. Cosmic-ray air showers produce neutrons and muons as secondary particles in the atmosphere. Traditionally, high-energy neutrons are thought to be a dominant source of soft errors in the terrestrial environment, and neutron white beams that reproduce the energy spectra on the ground are used for accelerated SEE testing. Meanwhile, it was recently revealed that muons can induce bit upsets in advanced SRAM memories. This talk discusses SEE testing for neutron- and muon-induced SEUs with emphasis on the facilities used in our work.

Q&A section