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Jean-Yves Rauch (Université de Franche-Comté)20/06/2023, 15:55
As part of a study on the properties of carbon nanotubes, we are going to briefly present the micro-Robotex station, which consists of a Zeiss Auriga 60 scanning electron microscope, on which are installed a Focused Ion Beam-FIB from Orsay Physics, a Gas Injection System-GIS from Oxford Instrument, and a robot with 6 degrees of freedom installed inside the vacuum chamber. By manufacturing...
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Ana Teresa Perez Fontenla (CERN)20/06/2023, 16:25
The microscopy team at CERN is devoted to providing material characterization including topographical imaging, morphology, phase identification and chemical analysis through the utilization of Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB)-SEM and X-ray Diffraction (XRD).
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Material characterization is carried out on a wide range of materials with emphasis on metals and alloys,...
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