Two Photon Absorption - Transient Current Technique: A 3D scanning tool for solid-state device characterisation
by
32/1-A24 - conference room
CERN
The Two Photon Absorption – Transient Current Technique (TPA-TCT) is a newly developed tool for the characterisation of radiation detectors. Contrary to present state of the art TCT, it allows to perform characterisation with a three dimensional spatial resolution. The setup at CERN is used to pioneer the technique with a tabletop setup that is designed for the investigation of silicon based detectors. It uses a 430 fs pulse fiber laser with a wavelength of 1550 nm, which is well beyond the linear absorption regime of silicon. Excess charge carriers are only generated in a small volume (approximately 1µm × 1µm × 20µm) around the focal point of the laser beam, which allows a resolution in all three spatial directions.
This talk introduces the methodology of the TPA-TCT, the tabletop setup, and the application of the TPA-TCT to various silicon detectors. Within the latter, studies of the gain reduction mechanism in Low Gain Avalanche Diodes (LGADs), characterisation of radiation damage in planar sensors, and techniques designed for the investigation of segmented sensors are presented.
Michael Moll and Burkhard Schmidt (EP-DT)