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May 26 – 31, 2024
Western University
America/Toronto timezone
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(G*) Shape of the capillary ridge on ideal elastomeric substrates

May 27, 2024, 11:15 AM
15m
PAB Rm 106 (cap. 96) (Physics & Astronomy Bldg, Western U.)

PAB Rm 106 (cap. 96)

Physics & Astronomy Bldg, Western U.

Oral Competition (Graduate Student) / Compétition orale (Étudiant(e) du 2e ou 3e cycle) Condensed Matter and Materials Physics / Physique de la matière condensée et matériaux (DCMMP-DPMCM) (DCMMP) M1-7 Soft Condensed Matter I | Matière condensée molle I (DPMCM)

Speaker

Lauren Dutcher

Description

Soft solids play an important role in stretchable electronics, cellular membranes and water collection. Upon introduction of a liquid contact line, soft solids can deform substantially causing changes to geometry and dynamics. On the nanoscale, the deformation at the liquid/solid contact line is a capillary ridge. We study these capillary ridges for a system which consists of a thin polymer film in the melt state atop an elastomeric poly(dimethylsiloxane) (PDMS) film. We use a thorough washing procedure to create our PDMS films which creates a true elastomer composed of only a crosslinked network. Our bilayer polymer films sit atop a solid silicon substrate. The liquid polymer layer dewets on the soft elastomer PDMS base. We vary the thickness of the underlying elastomer film, which changes the effective stiffness, therefore changing the size of the capillary ridge. We use atomic force microscopy to directly measure the shape of the capillary ridge in our system.

Keyword-1 Elastocapillarity
Keyword-2 Soft solid
Keyword-3 Thin polymer films

Primary author

Lauren Dutcher

Co-author

Prof. Kari Dalnoki-Veress (McMaster University)

Presentation materials

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