Speaker
Heather QUINN
(Los Alamos National Laboratory)
Description
As feature sizes of modern electronics continue to shrink, the study and mitigation of radiation effects in electronics has become an important part of high-reliability computing. In this talk trends in memory devices, field-programmable gate arrays and microprocessors that cause data corruption or computational failures will be presented. Mitigation methods that attempt to suppress the affect of radiation-induced failures will also be discussed.
Primary author
Heather QUINN
(Los Alamos National Laboratory)
