9–11 Nov 2011
Centro Nacional de Aceleradores - CNA
Europe/Zurich timezone

Non-Interceptive Profile Measurements via Light Emission-based Tomography Technique

Not scheduled
1m
Amphitheatre (Centro Nacional de Aceleradores - CNA)

Amphitheatre

Centro Nacional de Aceleradores - CNA

Av. Tomas Alba Edison,7 // Parque Cientifico y Tecnologico Cartuja 93, 41092, Sevilla, Spain
Talk

Speaker

Cherry May Mateo (CEA Saclay)

Description

High-intense particle accelerator beams require non-interceptive diagnostics to avoid damages during measurements. At CEA Saclay, the use of tomography to develop a non-interceptive transverse profile monitor is foreseen. This profile monitor is first tested on the BETSI ion source test bench and on SILHI (Source d’Ions Légers de Haute Intensité). Within the DITANET network, a tomography algorithm suited for beam profile measurements is developed and tested computationally and experimentally. These measurements utilize the optical measurement techniques based on the beam-residual gas interaction. A combination of optical profile measurements with tomography provides a significant impact on the development of beam profile monitors for high-intensity particle accelerator beam.

Author

Cherry May Mateo (CEA Saclay)

Presentation materials

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