Speaker
Jan Egberts
(CEA Saclay)
Description
In the frame of the International Fusion Material Irradiation Facility (IFMIF), a prototype for a non-interceptive transverse beam profile monitor based on residual gas ionization (IPM) has been built and characterized in detail. Based on these tests, the final IPM has been designed, built, and tested.
We present the design of the IPM based on FEM (Finite Element Method) field simulations and the results of test measurements performed at GSI Darmstadt with heavy ion beams of up to 1.6 mA at 5 MeV/u and at CEA Saclay with 80 keV protons in a cw high current beam. During the tests, parameters like extraction field strength, residual gas type and pressure, and beam position with respect to the IPM have been varied and the effects on the profile evaluated. Beam profiles were investigated with respect to signal intensity and profile shape. A profile comparison with a BIF-monitor (Beam Induced Fluorescence) indicates a good agreement of profiles acquired by the two profilers.
Author
Jan Egberts
(CEA Saclay)
Co-authors
Fabien Jeanneau
(CEA Saclay)
Jacques Marroncle
(CEA Saclay)
Jean-Philippe Mols
(CEA Saclay)
Philippe Abbon
(CEA Saclay)
Thomas Papaevangelou
(CEA Saclay)
